autopano-sift-C

SIFT Feature Detection implementation

The SIFT algorithm provides the capability to identify key feature points within arbitrary images. It further extracts highly distinct information for each such point and allows to characterize the point invariant to a number of modifications to the image. It is invariant to contrast/brightness changes, to rotation, scaling and partially invariant to other kinds of transformations. The algorithm can be flexibly used to create input data for image matching, object identification and other computer vision related algorithms. autopano-sift-C is a C port of the C# software autopano-sift. It is somewhat faster and doesn't require a C# runtime. Additionally, autopano-sift-C has experimental modifications to perform feature identification in conformal image space, this helps with wide angle or fisheye Projection photographs.

There is no official package available for openSUSE Leap 15.5